Designing High-Performance ATE, RF, or Communications Test Equipment? Here’s why you need Intel® Agilex™ FPGAs

It’s tough developing test equipment for leading-edge products because the test equipment must have all the functions and capabilities of the equipment being tested, and often just a bit more. This is a perfect place for using FPGAs, particularly the new, high-performance Intel® Agilex™ FPGAs and SoCs. If you are developing this type of test equipment, there’s an upcoming Webinar from Intel and Arrow titled Unleashing a New Generation of Test Equipment with Intel® Agilex™ FPGAs that might help you out. The Webinar will discuss real-world design and application insights for various types of ATE (Automatic test equipment) used in high-volume manufacturing test, RF test instrumentation, and communications testing.

This Webinar takes place on March 22 and will be available on demand as well.

 

Click here to register.

For more information about Intel Agilex FPGAs and SoCs, click here.

 

 

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Published on Categories 5G, Agilex, CommunicationsTags , ,
Steven Leibson

About Steven Leibson

Be sure to add the Intel Logic and Power Group to your LinkedIn groups. Steve Leibson is a Senior Content Manager at Intel. He started his career as a system design engineer at HP in the early days of desktop computing, then switched to EDA at Cadnetix, and subsequently became a technical editor for EDN Magazine. He’s served as Editor in Chief of EDN Magazine and Microprocessor Report and was the founding editor of Wind River’s Embedded Developers Journal. He has extensive design and marketing experience in computing, microprocessors, microcontrollers, embedded systems design, design IP, EDA, and programmable logic.